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205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 1 RDHA710SE10A2F neutron test report december 2005 international rectifier currently does not have a dscc approved radiation hardness assurance program for mil-prf-38534.
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 2 table of contents introduction .??????????????????. 3 summary of results ??????????????... 3 test method .?????????????????? 3 test plan .???????????????????. 3 test facility .??????????????????. 5 test results ? ?????????????????. 6 conclusion .??????????????????.. 7 appendix a ? electrical data appendix b ? radiation test specification appendix c ? neutron test setup appendix d ? neutron exposure certificates
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 3 introduction this test report covers the neut ron fluence tests performed on the RDHA710SE10A2F dual soli d-state-relay in a hermetic package. the neutron fluence test was performed to determine t he effects displacement damage had on the device performance. on december 21, 2005, international rectifier characterized this device for neutron hardnes s at the university of massachusetts, nuclear research facility using their fast neutron irradiator. summary of results all of the test samples passed the post radi ation test requirements for fluence levels up to 2e12 n/cm 2 . the results show degradation in the device?s propagation delay after exposure to neutron irradiation of 2e12 n/cm 2 . test method the test method used in the development of the test plan was mil-prf-883, method 1017 neutron irradiation. this me thod established the basic requirements for the performance and exec ution of the tests. test plan the samples were exposed to neutron irradiat ion in an un-biased st ate with all of the device leads open in a conductive bag. post r adiation testing of the devices occurred after the decay of radioactivi ty of the devices reached an acceptable safe level determined by the faciliti es personnel. the rate of decay was dependent on the amount of exposure to neutrons and the package materials. the devices were contained in a 20 +/-10c envir onment to minimize the e ffects due to annealing. the devices were tested on december 21, 2005 for post exposure effects. the radiation test specification is includ ed in appendix b. the testing occurred in the following manner: 1.0 purpose the purpose of this test is to characterize and es tablish neutron effects for international rectifier?s hybrid dual solid state relay . the data resulting from the tests may be incorporated in the ir data sheet for the product. 2.0 test responsibility international rectifier shall be responsible for cond ucting the tests, which shall be performed at the university of massachusetts research reactor facilit y. international rectifier shall be responsible for the final test report. 3.0 test facility 3.1 nuclear reactor the university of massachusetts research re actor shall be used to provide the necessary neutron beam and energy. university of ma ssachusetts research reactor (umrr) shall provide adequate dosimetry for verification of the neutron beam parameters. 3.2 test equipment the necessary test equipment including in terface board, cables, power supplies, measurement system, etc. shall be pr ovided by international rectifier.
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 4 3.3 sample size sample size shall be determined based on devic e type, characterization parameters. as a minimum, the sample size shall meet the requirements of mil-std-883, method 1017. the sample size for this test is 5 devices ( 10 circuits) and one device for a control sample. 4.0 test device 4.0 the following device is planned for neutron characterization: a. rdha710se10a2s 4.1 all devices shall be subjected to 160hrs of burn-in and verified for correct electrical performance prior to arrival at umrr. 4.2 the device leads will be open during this test and all parts shall be contained inside a conductive esd bag during irradiation. 5.0 test method mil-std-883, method 1017 shall be used to establ ish procedure for all testing described herein. 6.0 neutron source the nuclear reactor at lowell, mass is capabl e of providing fast neutron flux level > 10 11 n/cm 2 ? s with relatively low thermal fluence and gamma irradi ation. the fast neutron irradiator (fni) offers near uniform spectrum over a large cross-sectional area (12 11 x 12 11 x 6 11 ). the dosimetry system used to verify the radiation exposure was p-32, astm e-265. 7.0 record keeping the reactor facility shall provide dosimetry data fo r the fni. ir will be responsible for collecting and compiling the test data. 8.0 test procedure international rectifier shall control the following test procedure, based on test method 1017. ir?s design engineering department shall be responsibl e for selecting the neutron fluence level the product is exposed to. the facility personnel shall be responsible fo r loading and moving the device container. exposure levels shall be 1e10 n/cm 2 , 2e11 n/cm 2 , and 2e12 n/cm 2 . test procedure - table 1 step description conditions 1 pre test all devices prior to radiation exposure. per t090132g 2 place all devices in esd safe bag all device pins are open 3 place devices into the shielded container unbiased 4 lower the container into the irra diation chamber facilities personnel 5 expose the devices to pre-deter mined level see exposure levels 6 remove devices at completion of exposure time facilities personnel 7 allow devices to decay to safe level facilities personnel 8 test devices after post irradiation per t090132g 9 end test. read and record data
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 5 9.0 test report the test report shall include the following information. a. device type(s), serial numbers, wafer lot identification (per active component) b. test dates c. facility, source type d. fluence e. certificate of exposure f. bias conditions g. comments and observations h. pre and post electrical data i. summary descriptive including graphs test facility the university of massachusetts, lowell, nuclear research reactor is a 1 mega- watt, uranium 235 enhanced core reactor. the fast neutron irradiation (fni) chamber (see figure 1) is designed to give a fast flux level from 10 10 to 10 16 n/cm 2 -s with relatively low thermal fluence and gamma dose rates. it is also designed to provide a 1mev equivalent flux over the effective range. figure 1 reactor fuel lead/boron shielding flux filter irradiation chamber lead/ void
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 6 test results the key pre and post radiation test results ar e shown graphically in figures 2 thru 3. as outlined in the test plan, five devices were exposed to neutron irradiation at fluence levels of 1e10, 2e11, and 2e12 n/cm 2 . the devices were tested after completion of radiation exposure and r adioactive decay recovery. the data is displayed in the following graphs with t he average, minimum, and maximum for all the device samples shown. the radiatio n exposure had minima l effect on the samples up to a fluence level of 2e12 n/cm 2 . there were no catastrophic failures for any device. all parameters were within t he post radiation limits for the device. figure 2 ton 0.160 0.170 0.180 0.190 0.200 0.210 0.220 0.230 0.240 0.250 1 100 10000 1000000 1000000 00 1e+10 1e+12 fluence (n/cm2) ton (ms) min max average figure 3 toff 0.330 0.340 0.350 0.360 0.370 0.380 1 100 10000 1000000 100000000 1e+10 1e+12 fluence (n/cm2) toff (ms) min max average
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 7 conclusion the RDHA710SE10A2F has demonstrated hardness to neutron radiation exposure to a fluence level of 2e12 n/cm 2 with no effect on its ov erall performance and the results show it to meet all the post radiat ion test requirements. there are parametric shifts on the devices propagation delay at fluence levels above 2e11 n/cm 2 , which need to be considered in designs where tight tolerances over the life of the product need to be maintained.
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 8 appendix a electrical data
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 9 electrical test data (pre-radiation) test iqin idin iihss 1 iihss 2 io [leak] 1 io [leak] 2 rdson 1 r dson 2 ton 1 trise 1 ton 2 trise 2 toff 1 tfall 1 toff 2 tfall 2 max limit 1000 50 1000 1000 25000 25000 100 100 .45 . 40 .45 .40 .75 1.8 .75 1.8 min limit -1000 ---- -1000 -1000 ---- ---- ---- ---- ---- ---- ---- ---- ---- ---- ---- ---- serial # (na) (ma) (na) (na) (na) (na) (mohm) (mohm) (ms) (ms) (ms) (ms) (ms) (ms) (ms) (ms) 18 509 28.40 0.06 0.25 21.90 21.60 70.30 68.40 0.20 0.26 0.17 0.26 0.37 1.03 0.40 1.07 2 507 28.80 0.02 0.18 22.20 21.90 69.80 72.90 0.17 0.26 0.17 0.25 0.38 1.07 0.39 1.04 9 577 28.30 0.03 0.26 22.00 21.60 69.50 70.30 0.17 0.26 0.17 0.26 0.37 1.03 0.38 1.02 27 546 28.50 0.06 0.30 22.10 21.70 78.00 71.50 0.17 0.25 0.17 0.25 0.37 1.01 0.38 1.09 28 562 28.80 0.03 0.27 22.20 21.20 73.30 69.50 0.17 0.27 0.17 0.25 0.38 1.04 0.38 1.02 33 505 28.40 0.07 0.22 22.20 21.40 76.50 74.60 0.18 0.25 0.17 0.26 0.37 1.05 0.38 1.06 electrical test data (post 1e10 n/cm 2 exposure) test iqin idin iihss 1 iihss 2 io [leak] 1 io [leak] 2 rdson 1 r dson 2 ton 1 trise 1 ton 2 trise 2 toff 1 tfall 1 toff 2 tfall 2 max limit 1000 50 1000 1000 25000 25000 100 100 .45 .40 .45 .40 .75 1.8 .75 1.8 min limit -1000 ---- -1000 -1000 ---- ---- ---- ---- ---- ---- ---- ---- ---- ---- ---- ---- serial # (na) (ma) (na) (na) (na) (na) (mohm) (mohm) (ms) (ms) (ms) (ms) (ms) (ms) (ms) (ms) 18 109 28.50 0.12 0.26 30.90 30.00 85.90 82.10 0.20 0.26 0.18 0.26 0.37 0.99 0.53 1.51 2 109 28.90 0.12 0.28 31.60 31.30 85.50 89.50 0.17 0.27 0.19 0.29 0.38 1.00 0.54 1.52 9 102 28.40 0.13 0.26 31.70 30.80 85.00 85.40 0.17 0.27 0.18 0.28 0.37 1.04 0.54 1.47 27 151 28.60 0.14 0.29 31.30 31.30 89.70 86.60 0.17 0.25 0.18 0.27 0.38 1.05 0.51 1.52 28 118 28.90 0.12 0.43 31.20 30.60 93.60 84.20 0.17 0.26 0.18 0.29 0.38 1.02 0.52 1.46 33 140 28.50 0.16 0.36 31.50 30.40 88.90 89.50 0.17 0.25 0.18 0.26 0.38 1.00 0.54 1.52
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 10 electrical test data (post 2e11 n/cm 2 exposure) test iqin idin iihss 1 iihss 2 io [leak] 1 io [leak] 2 rdson 1 r dson 2 ton 1 trise 1 ton 2 trise 2 toff 1 tfall 1 toff 2 tfall 2 max limit 1000 50 1000 1000 25000 25000 100 100 .45 . 40 .45 .40 .75 1.8 .75 1.8 min limit -1000 ---- -1000 -1000 ---- ---- ---- ---- ---- ---- ---- ---- ---- ---- ---- ---- serial # (na) (ma) (na) (na) (na) (na) (mohm) (mohm) (ms) (ms) (ms) (ms) (ms) (ms) (ms) (ms) 18 111 28.40 invalid invalid 26.50 26.00 81.40 79.00 0.20 0.26 0.18 0. 26 0.37 0.97 0.55 1.47 2 95 28.70 invalid invalid 34.40 35.10 78.90 84.90 0.18 0.26 0.19 0.27 0.36 1.03 0.51 1.49 9 * * * * * * * * * * * * * * * * 27 110 28.50 invalid invalid 35.30 34.50 88.60 81.60 0.18 0.25 0.18 0.28 0.36 1.03 0.49 1.48 28 89 28.70 invalid invalid 35.40 35.10 82.70 79.10 0.18 0.26 0.18 0.28 0.36 1.02 0.50 1.51 33 129 28.40 invalid invalid 37.00 36.70 86.50 86.00 0.18 0.27 0.19 0.27 0.36 1.03 0.51 1.44 test system did not acquire valid leakage data. this was resolved for other levels of exposure. * device was not tested. operator error. electrical test data (post 2e12 n/cm 2 exposure) test iqin idin iihss 1 iihss 2 io [leak] 1 io [leak] 2 rdson 1 r dson 2 ton 1 trise 1 ton 2 trise 2 toff 1 tfall 1 toff 2 tfall 2 max limit 1000 50 1000 1000 25000 25000 100 100 .45 .40 .45 .40 .75 1.8 .75 1.8 min limit -1000 ---- -1000 -1000 ---- ---- ---- ---- ---- ---- ---- ---- ---- ---- ---- ---- serial # (na) (ma) (na) (na) (na) (na) (mohm) (mohm) (ms) (ms) (ms) (ms) (ms) (ms) (ms) (ms) 18 24 28.40 0.12 0.26 23.40 23.00 93.0 77.90 0.20 0.26 0.18 0.30 0.37 0.97 0.55 1.51 2 9 28.80 5 8 93.90 101.00 89.2 82.40 0. 23 0.27 0.24 0.28 0.34 1.03 0.48 1.49 9 22 28.40 3 6 95.40 94.20 100.0 88.20 0. 22 0.27 0.22 0.27 0.35 1.03 0.50 1.52 27 28 28.60 6 7 95.00 93.80 92.0 81.30 0. 23 0.26 0.23 0.27 0.34 1.00 0.48 1.49 28 39 28.90 7 5 98.80 98.00 96.0 78.70 0. 22 0.27 0.22 0.27 0.34 1.01 0.34 1.02 33 41 28.40 3 4 96.60 96.30 93.0 85.20 0. 24 0.26 0.22 0.27 0.34 1.00 0.48 1.53
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 11 appendix b radiation test specification
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 12 specification # t090133g revision: b ecn # date: ir base part no. RDHA710SE10A2F product discription: 10a dual solid state relay (fast) automatic test tester: pxi test console 04-134-tc prog. ref. test symbol test conditions rad level: min max units this is proprietary information of international rectifier hi-rel products and it is understood that this will not be divulged to a third party or used in any way prejudicial to the interest of international rectifier hi-rel products. 0.75 ms ---- 1.80 ms 0.40 ms vdd = 5.0v, in1 = 0v, in2 = 3.3v, vs = 30v, rlc = 7 ? / 100uf, pw = 50ms a fall time tf2 pre rad vdd = 5.0v, in1 = 0v, in2 = 0v, vs = 30v, rlc = 7 ? / 100uf, pw = 50ms aturn off delay a rise time tr2 pre rad a fall time tf1 ms arise time tr1 a turn off delay toff1 0.75 ms 0.40 ms ---- ---- toff2 pre rad ---- 0.45 ms vdd = 5.0v, in1 = 3.3v, in2 = 0v, vs = 30v, rlc = 7 ? / 100uf, pw = 50ms ms pre rad a turn on delay ton1 pre rad pre rad ---- 100 m ? a output on resistance rdson2 vdd = 5.0v, in1 = 0v, in2 = 3.3v, io2 = 10a ---- 25 ua 100 m ? table 1: pre radiation tests, 25c tests only 25 ua a output leakage a a output leakage ioleak1 1ua in buffer curr ihss2 vdd = 5.0v, in1 = 0v, in2 = 3.3v pre rad -1 1 ua ihss1 a in supply curr a a in buffer curr vdd = 5.0v, in1 = 3.3v, in2 = 0v pre rad in supply curr pre rad vdd = 5.0v, in1 = in2 = 0v iqin idin vdd = 5.0v, in1 = in2 = 3.3v pre rad notes ---- -1 ---- a output on resistance rdson1 vdd = 5.0v, in1 = 3.3v, in2 = 0v, io1 = 10a pre rad vdd = 5.0v, in1 = 0.1v, in2 = 0v, vo1 = 100v pre rad ioleak2 vdd = 5.0v, in1 = 0v, in2 = 0.1v, vo2 = 100v pre rad pre rad pre rad vdd = 5.0v, in1 = 0v, in2 = 0v, vs = 30v, rlc = 7 ? / 100uf, pw = 50ms ---- ---- 1.80 ---- 0.45 ---- a turn on delay ton2 pre rad -1 1 ua ---- 50 ma
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 13 automatic test tester: pxi test console 04-134-tc prog. ref. test symbol test conditions rad level: min max units this is proprietary information of international rectifier hi-rel products and it is understood that this will not be divulged to a third party or used in any way prejudicial to the interest of international rectifier hi-rel products. vdd = 5.0v, in1 = 0v, in2 = 3.3v, vs = 30v, rlc = 7 ? / 100uf, pw = 50ms vdd = 5.0v, in1 = 0v, in2 = 0v, vs = 30v, rlc = 7 ? / 100uf, pw = 50ms 1 ms ms in supply curr idin vdd = 5.0v, in1 = in2 = 3.3v table 2: post radiation tests, 25c tests only ua -1 notes b in supply curr iqin vdd = 5.0v, in1 = in2 = 0v post rad post rad ---- b output leakage ioleak1 vdd = 5.0v, in1 = 0.1v, in2 = 0v, vo1 = 100v post rad b 50 ma b in buffer curr ihss1 vdd = 5.0v, in1 = 3.3v, in2 = 0v post rad -1 1 ua b in buffer curr ihss2 vdd = 5.0v, in1 = 0v, in2 = 3.3v post rad -1 1 ua ---- 25 ua b output leakage ioleak2 vdd = 5.0v, in1 = 0v, in2 = 0.1v, vo2 = 100v post rad ---- 25 ua b output on resistance rdson1 vdd = 5.0v, in1 = 3.3v, in2 = 0v, io1 = 10a post rad ---- 100 m ? ---- 100 m ? b output on resistance rdson2 vdd = 5.0v, in1 = 0v, in2 = 3.3v, io2 = 10a ---- 0.45 ms post rad b rise time tr1 post rad vdd = 5.0v, in1 = 3.3v, in2 = 0v, vs = 30v, rlc = 7 ? / 100uf, pw = 50ms b turn on delay ton1 post rad b turn off delay toff1 post rad vdd = 5.0v, in1 = 0v, in2 = 0v, vs = 30v, rlc = 7 ? / 100uf, pw = 50ms ---- 0.40 ms ---- 0.75 tr2 ms b fall time tf1 post rad ---- 1.80 ms b turn off delay toff2 post rad post rad b turn on delay ton2 b rise time ---- 0.45 ---- 0.75 ---- 0.40 ms b fall time tf2 post rad ---- 1.80 ms post rad
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 14 pre radiation tests post radiation tests test type test system program name apre rad pxi 05-028-ts bpost rad pxi 05-028-ts notes fast neutron irradiator facility @ umass, lowell 2. 3. 04-135-tf, 04-107-002-p pxi 04-134-tc program location 1.0e+10, 2e+11, 1.8e+12 table 5: test hardware test fixture test system 4. performed during initial qualification of the device and retested only when specified by quality assurance due to a change p er mil-prf-38534. the sample size for the hybrid qualification is 5 devices (10 circuits); 1 device will not be irradiated and used as a control samp le. 5. all handling guidelines for neutron irradiated product outlined in t030061g must be followed for this multiple exposure test . fluence steps are considered cumulative. table 4: neutron radiation requirements 4, 5 fluence step profile test procedure t030061g test temperature 20c +/-10c equivalent fluence 1mev (neutrons/cm 2 ) all pins open. parts inside an esd conductive bag. bias conditions 04-135-tf, 04-107-002-p pxi 04-134-tc table 6: test programs c:\pxi_testsoftware_testdata\testprograms\05-28-ts_omr9707\05-028-ts.llb\05-028-ts.vi c:\pxi_testsoftware_testdata\testprograms\05-28-ts_omr9707\05-028-ts.llb\05-028-ts.vi 1.
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 15 appendix c neutron test set up
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 16 neutron irradiation set up 1. devices are placed into the aluminum / boron container. 2. the container is then lower ed into the irradiation chamber. 3. at the completion of the run time, remo ve container from the radiation chamber. 4. allow devices to decay (radioactive) to an acceptable safe level before testing. 5. repeat process as required.
205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 17 appendix d neutron exposure certificate

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